The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Mar. 23, 2022
Apple Inc., Cupertino, CA (US);
Li Li, Los Altos, CA (US);
Mohanasundaram Kattavoor Sivakumar, Mountain View, CA (US);
Dennis D. Conway, Campbell, CA (US);
Zexing Shi, San Jose, CA (US);
Aurelien P. Raboisson, Torrance, CA (US);
Ngabin S. Ng, Rowland Heights, CA (US);
Rajeev Verma, San Jose, CA (US);
Raj S. Chaugule, Santa Clara, CA (US);
Keizo Marui, New Dundee, CA;
Lukas M. Bugla, Fremont, CA (US);
Patrick L. Coffman, San Francisco, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Embodiments are described herein for transferring a subscriber identity module (SIM) or electronic SIM (eSIM) profile securely from a source device to a target device with verifiable signatures generated by secure hardware elements of the source device contingent on receipt of a secure intent gesture. Trustworthiness of the profile transfer is based on a mobile network operator (MNO) entitlement server releasing a transfer token after verification of a message signed by an embedded universal integrated circuit card (eUICC) of the source device. The eUICC signs the message only after verifying a message from a secure enclave processor (SEP) of the source device that signs the message based on receipt of the secure intent gesture via a secure interface. To validate communication between the SEP and the eUICC, an asymmetric cryptographic key pair generated by the SEP is bound to a unique eUICC identifier (EID) value of the eUICC.