The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Nov. 18, 2022
Wells Fargo Bank, N.a., San Francisco, CA (US);
Abhijit Bhima Rao, Irvine, CA (US);
Jeff J. Stapleton, O'Fallon, MO (US);
Richard Wade Phillips, Charlotte, NC (US);
Robert L. Carter, Jr., Pleasant Hill, IA (US);
Palak J. Desai, Mountain House, CA (US);
Naman A. Aggarwal, San Francisco, CA (US);
Ramanathan Ramanathan, Bellevue, WA (US);
Phillip H. Griffin, Raleigh, NC (US);
Wells Fargo Bank, N.A., San Francisco, CA (US);
Abstract
Systems, apparatuses, and methods are disclosed for measuring one or more metrics of a cryptographic algorithm in a post-quantum cryptography (PQC) system. An example method includes obtaining a set of operating parameters comprising an algorithm of interest, wherein the algorithm of interest is a PQC algorithm, a legacy algorithm operating in a hybrid PQC system, or a variant thereof, and wherein the algorithm of interest is wrapped to present, via a wrapped algorithm of interest, a standardized interface to a sequence of benchmark operations. The example method further includes observing benchmark values of the one or more metrics, wherein the one or more metrics pertain to a designated benchmark operation from the sequence of benchmark operations. The example method further includes outputting a report comprising the benchmark values of the one or more metrics.