The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Sep. 27, 2017
Applicant:
Zte Corporation, Shenzhen, CN;
Inventors:
Yijian Chen, Shenzhen, CN;
YUNgok Li, Shenzhen, CN;
Zhaohua Lu, Shenzhen, CN;
Nan Zhang, Shenzhen, CN;
Hao Wu, Shenzhen, CN;
Assignee:
ZTE CORPORATION, Guangdong, CN;
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04B 17/336 (2015.01); H04L 1/00 (2006.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04L 5/0073 (2013.01); H04B 17/336 (2015.01); H04L 1/0026 (2013.01); H04L 5/0051 (2013.01); H04W 24/10 (2013.01);
Abstract
The present disclosure provides an interference measurement method, an apparatus and a system, and an interference measurement indication method and apparatus. The interference measurement method includes: obtaining an interference measurement resource configuration and an interference measurement reception mode configuration; and performing the interference measurement according to the interference measurement resource configuration and the interference measurement receiving mode configuration.