The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Dec. 06, 2023
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Toshitha Jagadeesh, Seattle, WA (US);

David C. James, Snohomish, WA (US);

Brad R. Anderson, Sammamish, WA (US);

Yian Mo, Redmond, WA (US);

Brett Damon Alan Flegg, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 41/0813 (2022.01); G06Q 10/0631 (2023.01); G06Q 30/0208 (2023.01);
U.S. Cl.
CPC ...
H04L 41/0813 (2013.01); G06Q 10/06313 (2013.01); G06Q 30/0208 (2013.01);
Abstract

Techniques are described herein that are capable of providing a recommendation of an admin change (i.e., an admin change recommendation) in an enterprise. A type of intended admin change that an administrator is to perform with regard to an enterprise is determined. The type is cross-referenced with information indicating admin changes made by administrator(s) in environment(s) of enterprise(s) and values of metrics resulting therefrom to identify subsets of the information to which the type corresponds. A causal relationship is inferred between admin change(s) made after an admin change of the type and an increase in value(s) of metric(s) that are indicated by information in the subsets. A recommended admin change is recommended to be performed by the administrator based at least in part on a causal relationship between the recommended admin change and an increase in at least one of the value(s) of at least one of the respective metric(s).


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