The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Aug. 15, 2022
Applicant:

Hrl Laboratories, Llc, Malibu, CA (US);

Inventors:

Ryan Quarfoth, Malibu, CA (US);

Christopher Roper, Malibu, CA (US);

Jacob Hundley, Malibu, CA (US);

Assignee:

HRL LABORATORIES, LLC, Malibu, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 5/45 (2015.01); H01Q 1/28 (2006.01); H01Q 1/38 (2006.01); H01Q 19/02 (2006.01); H04B 7/0426 (2017.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H01Q 5/45 (2015.01); H01Q 1/286 (2013.01); H01Q 1/38 (2013.01); H01Q 19/022 (2013.01); H04B 7/043 (2013.01); H04B 17/11 (2015.01); H04B 17/21 (2015.01);
Abstract

An apparatus and related method are disclosed for compensation of an antenna and/or an antenna array located at a surface that experiences environmental conditions. The apparatus can include: an embedded compensation and/or calibration structure configured to be interrogated by an electromagnetic wave, to dynamically compensate for surface erosion, thermal expansion, and/or dielectric constant changes of a surface scattering antenna; and a processor configured to: receive measurements of the compensation and/or calibration structure to determine beam pointing for dynamically varying surface conditions and perform sensing and/or seeking observation.


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