The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Jan. 07, 2022
Applicant:

Shanghai Integrated Circuit Manufacturing Innovation Center Co., Ltd., Shanghai, CN;

Inventors:

Bao Zhu, Shanghai, CN;

Rui Yin, Shanghai, CN;

Wei Zhang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/528 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76843 (2013.01); H01L 21/76802 (2013.01); H01L 21/76877 (2013.01); H01L 23/528 (2013.01);
Abstract

The present invention provides a metal interconnection structure and a manufacturing method thereof, the metal interconnection structure includes: metal interconnection lines disposed at intervals, first metal layers respectively disposed on the metal interconnection lines; second metal layers respectively disposed on the first metal layers; dielectric layers disposed on both sides of the first metal layer and the second metal layer and having a gap with both the first metal layer and the second metal layer; and a metal diffusion covering layer covering the dielectric layer and the second metal layer. In the present invention, by disposing the dielectric layer on both sides of the first metal layer and the second metal layer, and the dielectric layer has a gap with both the first metal layer and the second metal layer, and the formed metal interconnection structure reduces parasitic capacitance due to the gap, and the gaps existing between the first metal layer and the dielectric layer and between the second metal layer and the dielectric layer can further reduce the diffusion of metal ions to the dielectric layer.


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