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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12198482 B1

PDFFull Text
Date of Patent:
Jan. 14, 2025

Filed:

Feb. 07, 2022

System and method for determining vehicle component conditions

Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Anurag Ganguli, Milpitas, CA (US);

Rajinderjeet Singh Minhas, Mountain View, CA (US);

Johan de Kleer, Los Altos, CA (US);

Assignee:

XEROX CORPORATION, Norwalk, CT (US);

Attorney:

Krista A. Wittman

Primary Examiner:

Bao Long T Nguyen

Int. Cl.
CPC ...
G07C 5/08 (2006.01); G06Q 10/20 (2023.01); G06Q 30/014 (2023.01); G06Q 30/018 (2023.01); G07C 5/00 (2006.01); G06Q 50/40 (2024.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); G06Q 10/20 (2013.01); G06Q 30/014 (2013.01); G06Q 30/018 (2013.01); G07C 5/006 (2013.01); G06Q 50/40 (2024.01);
Abstract

A system and method for determining vehicle component conditions is provided. A predictive model is built for a vehicle component and values are mapped for a feature of the vehicle component using the predictive model. A threshold is applied to the mapped values. An occurrence of a fault of the vehicle component is predicted when one or more of the mapped values exceeds the threshold and an extended optimal interval during which the fault is predicted to occur is identified.

Find Patent Forward Citations

Ganguli, Anurag. (2025). System and method for determining vehicle component conditions (U.S. Patent No. 12198482). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12198482

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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