The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
May. 22, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Yoshiaki Takimoto, Tokyo, JP;
Yusuke Tanaka, Tokyo, JP;
Takeshi Kurashima, Tokyo, JP;
Shuhei Yamamoto, Tokyo, JP;
Maya Okawa, Tokyo, JP;
Hiroyuki Toda, Tokyo, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
A hazard estimation unitestimates a likelihood of an occurrence of an event according to a hazard function, with respect to each of a plurality of pieces of time-series data that are a series of multiple pieces of data to which an event occurrence time relevant to the data is given in advance and that include time-series data in which the event did not occur and time-series data in which the event occurred. A parameter estimation unitestimates a parameter of the hazard function so as to optimize a likelihood function expressed by including the event occurrence time given with respect to each of the plurality of pieces of time-series data and the likelihood of the occurrence of the event estimated with respect to each of the plurality of pieces of time-series data.