The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Jun. 30, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A defect detection method applied to an electronic device includes determining, pixel difference values based a test sample image and positive sample images. A color difference threshold is determined according to positive sample images. Feature connected regions of the test sample image are generated according to the color difference threshold and pixel difference values. A first threshold is generated according to image noises of positive sample images. A target region is determined from the feature connected regions according to a number of pixel points in each feature connected region and the first threshold. Once a second threshold is determined according to defective pixel points of negative sample images, a detection result of a test sample is determined according to an area of the target region and the second threshold.