The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Oct. 25, 2019
Applicant:

The Regents of the University of Michigan, Ann Arbor, MI (US);

Inventors:

Kenn Oldham, Ann Arbor, MI (US);

Thomas D. Wang, Ann Arbor, MI (US);

Mayur Bhushan Birla, Ann Arbor, MI (US);

Xiyu Duan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/73 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 5/73 (2024.01); G06T 7/0012 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A computer-implemented method includes receiving a raw data set representing an image of a sample, identifying a first set of extremum by analyzing the raw data set using a metric algorithm, identifying a second set of extremum by analyzing the first set of extremum, and generating, based on the second set of extremum, a reconstructed image of the sample. A phase correcting scanner includes one or more processors, one or more scanner adapted to sequentially sample an object to generate a vector of raw data representing the object in a Lissajous pattern, and memory storing instructions that, when executed by the one or more processors, cause the computing system to receive the vector of raw data, identify a first set of extremum by analyzing the raw data set using a metric algorithm, and identify a second set of extremum by analyzing the first set of extremum.


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