The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Aug. 19, 2020
Accenture Global Solutions Limited, Dublin, IE;
Rajeev John, Pune, IN;
Priya Das, Bangalore, IN;
Vivek Kumar Pandey, Bangalore, IN;
Vismay Vyas, Pune, IN;
Srinivasan Ramaswamy, Chennai, IN;
Satyaki Bhattacharya, Kolkata, IN;
Anal Kumar De, Kolkata, IN;
Sanjaykumar Joshi, Bangalore, IN;
Jayant Swamy, Bangalore, IN;
Aniruddha Ray, Bangalore, IN;
ACCENTURE GLOBAL SOLUTIONS LIMITED, Dublin, IE;
Abstract
A system for assessing a data model includes a data receiver, a model receiver, and a model assessment device. The data receiver receives training data, historical data, and production data. The model receiver receives the data model associated with the historical data and trained using the training data. The historical data includes a first outcome of the data model provided based on an input feature in the production data. The model assessment device identifies a key feature in the production data relative to the input feature based on a target category in the historical data and a statistical distribution of the input feature in the production data. The model assessment device determines a second outcome of the data model based on the key feature. In response to the second outcome being different from the first outcome, the model assessment device determines a veracity score for assessing the data model.