The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Jul. 14, 2023
Applicant:
Western Digital Technologies, Inc., San Jose, CA (US);
Inventors:
Maharudra Nagnath Swami, Bangalore, IN;
Nitin Jain, Bangalore, IN;
Assignee:
Sandisk Technologies, Inc., Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/076 (2013.01);
Abstract
A read to a wordline can cause a read disturb error on neighboring wordlines. Instead of scanning the entire memory to identify wordlines that have a read disturb problem, a localized read scan approach can be used. In this approach, the memory is organized into several zones, where each zone contains several wordlines. The number of reads in each zone is tracked, and, after a certain number of reads, the data in the zone is read. If the error rate of the data exceeds a threshold, the data is relocated to another area of the memory.