The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Jan. 28, 2022
Applicant:
Ronald Michael Caronia, Syosset, NY (US);
Inventors:
Ronald Michael Caronia, Syosset, NY (US);
Edward Allen DeHoog, Long Beach, CA (US);
Assignee:
[object Object];
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/00 (2006.01); A61B 3/12 (2006.01); A61B 3/135 (2006.01); G02B 13/00 (2006.01); G02B 25/00 (2006.01);
U.S. Cl.
CPC ...
G02B 25/001 (2013.01); A61B 3/12 (2013.01); A61B 3/135 (2013.01); G02B 13/0095 (2013.01);
Abstract
The disclosure relates to an eyepiece extender for an ophthalmic microscope, such as a slit lamp microscope. The eyepiece extender comprises certain lens designs and arrangements and provides ergonomic improvement to a user of the ophthalmic microscope and accommodates different magnifications, such as high and low magnifications, while preserving image fidelity for each magnification such that the image is essentially distortion free and color corrected in each magnification instance.