The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Dec. 28, 2020
Kimball Electronics Indiana, Inc., Jasper, IN (US);
Sangtaek Kim, Dublin, CA (US);
Yan Cheng, San Jose, CA (US);
Paul Brunemeier, Sunnyvale, CA (US);
Athinarayanan Sankaranarayanan, Tamilnadu State, IN;
Kimball Electronics Indiana, Inc., Jasper, IN (US);
Abstract
An imaging system and method for leakage detection uses schlieren imaging to locate and characterize a flow of pressurized gas with a refractive index different than ambient air. In particular, a schlieren imaging system includes a collimated light, a knife-edge spatial filter and a 4F telescopic imaging system is used to create an image of a device under test (DUT). The DUT is pressurized and monitored for leaks. When a leak is present and in the monitored plane of the DUT, contrast variation illustrates the presence, location and character of the leak. For example, a waterproof/leakproof mobile device may be evaluated for leakage between layers of modules, such as leaks in the housing of a waterproof electronics case. This detection can allow identification and characterization of the leak point via visual identification.