The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Aug. 27, 2021
Nikon Corporation, Tokyo, JP;
Yosuke Fujikake, Yokohama, JP;
Shigeru Nakayama, Yokohama, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A microscope includes: illumination optical system irradiating specimen with light and forming fringe illumination; scanning part performing scanning with relative movement between fringe illumination and specimen; phase modulation element setting fringe illumination to a plurality of phase states; a plurality of detectors detecting light from specimen; and image processor generating output image with detection results of predetermined two or more detectors, wherein image processor uses detection results of each of predetermined two or more detectors to generate at least first image, which is detected when fringe illumination is in first phase state, and second image, which is detected when fringe illumination is in second phase state, for each detector, generates intermediate image for each detector by correcting first image and second image based on position of corresponding detector, period of fringe illumination, first phase, and second phase, and generates output image from the plurality of intermediate images.