The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Nov. 17, 2021
Applicant:
Carl Zeiss Meditec Ag, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); A61B 90/20 (2016.01);
U.S. Cl.
CPC ...
G02B 21/0012 (2013.01); G02B 21/365 (2013.01); A61B 90/20 (2016.02);
Abstract
A parameterization of a control algorithm of a surgical microscope is carried out on the basis of one or more context parameters of an operation. On the basis of the parameterization, the control algorithm then is applied to one or more state indicators associated with a first setting of the surgical microscope in order thus to obtain a second setting of the surgical microscope. By way of example, the parameterization can comprise one or more prioritization operations.