The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Apr. 08, 2021
Applicant:

Polaris Wireless, Inc., Mountain View, CA (US);

Inventors:

Jerome Arthur Blaha, Jr., Redwood City, CA (US);

Scot Douglas Gordon, Redmond, CA (US);

Jeffrey Noel Wu, Santa Clara, CA (US);

Jian Zhu, Cupertino, CA (US);

Assignee:

Polaris Wireless, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01W 1/04 (2006.01); G01L 9/00 (2006.01); G01W 1/00 (2006.01);
U.S. Cl.
CPC ...
G01W 1/04 (2013.01); G01L 9/0033 (2013.01); G01W 2001/006 (2013.01);
Abstract

A method for providing an enhanced estimate of reference barometric pressure. The method uses multiple, dissimilar pressure references, such as in airport weather stations, personal weather stations, and wireless terminals such as smartphones, in order to provide the enhanced estimate of reference barometric pressure. The method generates an enhanced estimate of reference barometric pressure based on a first estimate of reference barometric pressure from a first pressure reference network made up of airport weather stations, for example. The method also uses a second estimate of reference barometric pressure from a second pressure reference network made of up personal weather stations, for example, and a third estimate of reference barometric pressure, also from the second network. The first, second, and third estimates of reference barometric pressure are combined such that both measurement accuracy and timeliness are improved in the resulting, enhanced estimate.


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