The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Mar. 02, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Moshe Laifenfeld, Haifa, IL;

Zeev Roth, Kadima-Tsoran, IL;

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 17/04 (2020.01); G01S 17/10 (2020.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 17/04 (2020.01); G01S 17/10 (2013.01);
Abstract

Depth sensing apparatus includes a radiation source, which emits a first array of beams of light pulses through a window toward a target scene. Objective optics image the target scene onto a second array of sensing elements, which output signals indicative of respective times of incidence of photons. A first calibration, which associates the beams in the first array with respective first locations on the second array onto which the beams reflected from the target scene are imaged, is used in processing the signals in order to measure respective times of flight of the light pulses. A second calibration indicates second locations on which stray radiation is incident on the second array due to reflection of the beams from the window. Upon detecting a change in the second locations relative to the second calibration, the first calibration is corrected so as to compensate for the detected change.


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