The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Mar. 24, 2020
Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E. V., Munich, DE;
Julius-maximilians-universität Würzburg, Würzburg, DE;
Karl-Sebastian Mandel, Würzburg, DE;
Stephan Müssig, Würzburg, DE;
Susanne Wintzheimer, Würzburg, DE;
Florian Fidler, Erlangen, DE;
Daniel Haddad, Erlangen, DE;
Karl-Heinz Hiller, Erlangen, DE;
Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V., Munich, DE;
Julius-Maximilians-Universität Würzburg, Würzburg, DE;
Abstract
The invention relates to a method for detecting and/or identifying magnetic supraparticles using magnet particle spectroscopy (MPS) or magnet particle imaging (MPI), wherein magnetic supraparticles are provided, each of which contains a plurality of magnetic nanoparticles and which have a specific composition and/or structure. The magnetic supraparticles are exposed to at least one magnetic field, whereby at least one voltage and/or a voltage curve is induced based on the magnetic moment of the magnetic supraparticles. The at least one voltage and/or the voltage curve is detected as at least one measurement signal, and at least one spectrum is generated from the at least one measurement signal, said spectrum containing harmonics, each of which has an amplitude and a phase. The magnetic supraparticles are (uniquely) detected and/or identified using the at least one generated spectrum.