The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Sep. 24, 2022
Applicant:

National Radio Research Agency, Naju-si, KR;

Inventors:

Kang Wook Kim, Gwangju, KR;

Soon Soo Oh, Gwangju, KR;

Young Bae Jung, Daejeon, KR;

Jong Hyuk Lim, Icheon-si, KR;

Jung Kuy Park, Yeoju-si, KR;

Sam Young Jung, Icheon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); G01S 1/02 (2010.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 29/0821 (2013.01); G01R 29/0871 (2013.01); G01R 29/0878 (2013.01); G01S 1/022 (2013.01);
Abstract

Disclosed is a radio wave device test system, comprising a fixed part configured to fix a radio wave device; a positioner system configured to control a rotation of the radio wave device by controlling the fixed part; an arch structure whose central point is located at a position where the radio wave device is located; a plurality of probes disposed to be spaced apart from one another at fixed intervals in the arch structure, and configured to receive a radio frequency (RF) signal from the raid wave device; and a plurality of receiving modules located at the plurality of probes, respectively, and configured to transform the RF signal into in-phase/quadrature (I/Q) data by carrying out digital transformation for the RF signal and to detect information on amplitude and a phase from the I/Q data.


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