The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Mar. 14, 2023
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.