The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
May. 10, 2024
Shanghai Jiaotong University, Shanghai, CN;
SHANGHAI JIAOTONG UNIVERSITY, Shanghai, CN;
Abstract
A non-destructive measurement method and apparatus for the turn-to-turn resistivity distribution (TTRD) in non-insulation (NI) superconducting coils. The method includes: during the discharging or charging process, obtaining experimental values of voltage varying over preset time at different positions of the test coil; dividing the test coil into a plurality of measurement units and obtaining basic circuit elements; then constructing a preset equivalent circuit model including the basic circuit elements; based on the constructed equivalent circuit model, obtaining the first simulated values of voltage varying over preset time at different positions of the test coil; finally, determining the TTRD of the test coil based on the fitness value between experimental values and the first simulated values. When there is high fitness value between the first simulated values and experimental values, the TTRD corresponding to the first simulated values is considered as the TTRD within the test coil.