The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Jul. 19, 2024
China Special Equipment Inspection & Research Institute, Beijing, CN;
China Special Equipment Inspection & Research Institute, Beijing, CN;
Abstract
A wide-temperature-range uniaxial and biaxial compression test device in a high-pressure hydrogen environment is provided. An upper computer is interacted with a temperature sensor, a gas pressure sensor, test pressure sensors, displacement sensors, an oxygen/hydrogen concentration monitor, a hydrogen filling system, a vacuum extraction system, a DIC test system, and the other components. The upper computer is used to achieve high-pressure hydrogen environment wide-temperature-range uniaxial and biaxial compression test based on different test modes. Tested engineering stress-strain data is processed to obtain real stress-strain data of rubber, and then the real stress-strain data is processed through a corresponding database to screen out a constitutive model capable of best characterizing the nonlinearity of the rubber specimen. Meanwhile, a strain distribution nephogram generated by a test result of a sample material can be analyzed, thus obtaining a deformation behavior and a failure fracture mechanism of the sample material.