The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Sep. 02, 2024
Hefei University of Technology, Anhui, CN;
Peng Gao, Hefei, CN;
Xue Zhang, Hefei, CN;
Zongcheng Yin, Hefei, CN;
Zhiqiang Wang, Hefei, CN;
Xuan Yang, Hefei, CN;
HEFEI UNIVERSITY OF TECHNOLOGY, Hefei, CN;
Abstract
Disclosed is a test method for measuring a force situation of a tree-shaped spatial node, and the test method is realized by a reaction frame device. The reaction frame device includes a raft foundation and a reaction frame fixedly mounted on the raft foundation, a cavity is formed inside the reaction frame to accommodate a tree-shaped spatial node; a main pipe of the tree-shaped spatial node is plumb-fastened to the raft foundation, and a force measurement assembly is arranged in an upper space of the cavity, which can simultaneously apply force of a set value to each branch pipe in the tree-shaped spatial node and detect a combined force applied to the tree-shaped spatial node. The method can simultaneously and accurately apply static force to each branch pipe, thereby effectively predicting the overall working condition of the tree-shaped spatial node.