The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
May. 05, 2021
Hand Held Products, Inc., Charlotte, NC (US);
Suresh Venkatarayalu, Waxhaw, NC (US);
Moin Shafai, Plano, TX (US);
Chen Feng, Mount Laurel, NJ (US);
Jennifer Burnett, Houston, TX (US);
Giorgio Carlo Isella, Torrance, CA (US);
Robert Timothy Kester, Friendswood, TX (US);
Benjamin P. Heppner, Fridley, MN (US);
James A. Lopac, Roseville, MN (US);
Lisa M. Lust, Plymouth, MN (US);
Mary Katherine Salit, Plymouth, MN (US);
Matthew Wade Puckett, Phoenix, AZ (US);
William McGraw, Flower Mound, TX (US);
Hand Held Products, Inc., Charlotte, NC (US);
Abstract
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.