The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Jun. 22, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Touya Ono, Tokyo, JP;

Mizuki Mohara, Tokyo, JP;

Kei Shimura, Tokyo, JP;

Kenji Aiko, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01);
Abstract

This far-infrared spectroscopy device comprises a holding mechanism that is capable of holding a sample in humid air, a detector for detecting light obtained by emitting far infrared light onto the sample, and a signal processing unit for calculating an absorption spectrum of the sample from a signal from the detector. The signal processing unit comprises a threshold processing unit that subjects the signal from the detector to threshold processing and removes the part of the signal influenced by the absorption by the water vapor in the humid air, a signal interpolation unit that carries out interpolation on the signal that has been subjected to the removal by the threshold processing unit, and an absorbance calculation unit for calculating an absorbance from the signal that has been subjected to the interpolation by the signal interpolation unit.


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