The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Apr. 08, 2022
Applicant:

Automated Precision Inc., Rockville, MD (US);

Inventors:

Yongwoo Park, Rockville, MD (US);

Shuai Sun, Rockville, MD (US);

Kam Lau, Rockville, MD (US);

Assignee:

AUTOMATED PRECISION INC., Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/0209 (2022.01); G01B 9/02004 (2022.01);
U.S. Cl.
CPC ...
G01B 9/0209 (2013.01); G01B 9/02004 (2013.01); G01B 2290/20 (2013.01); G01B 2290/25 (2013.01); G01B 2290/35 (2013.01); G01B 2290/70 (2013.01);
Abstract

A broadband interferometry for a measurement range extension beyond a coherence length of a light source is achieved through a local oscillation of the reference beam is replicated by a cavity multiplication or cascading optical delayed lines with a fiber optic cavity, and quantifiable optical properties including a wavelength group delay, a chromatic dispersion, a polarization mode dispersion and a model dispersion are inserted into the local oscillation of the reference beam to incrementally quantify the replicated copies of the local oscillation as the number of the delayed copies of the local oscillation increase for extension of a measurement rage to the target.


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