The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Oct. 04, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Toru Takahashi, Tokyo, JP;

Rui Ishiyama, Tokyo, JP;

Kengo Makino, Tokyo, JP;

Takashi Shibata, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G01B 21/30 (2006.01); G01N 27/90 (2021.01);
U.S. Cl.
CPC ...
G01B 21/30 (2013.01); G01N 27/9046 (2013.01); G06T 7/11 (2017.01); G06T 2207/20081 (2013.01);
Abstract

A surface property estimation system includes an image acquisition means for acquiring an image of a surface of an object, an estimation means for estimating a surface property from the acquired image by using an estimation model obtained through machine learning with use of an image of a surface of an object and a surface property shown by the image as training data, an extraction means for extracting, from the acquired image, a feature amount unique to the image, and a registration means for storing the estimated surface property and the extracted feature amount in a storage means in association with each other.


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