The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Nov. 10, 2022
Applicant:

Singer Sourcing Limited Llc, Nashville, TN (US);

Inventors:

Mattias Nilsson, Ingatorp, SE;

Laura Kvarnstrand, Habo, SE;

Assignee:

Singer Sourcing Limited LLC, Nashville, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D05B 19/12 (2006.01); D05B 29/06 (2006.01); D05B 55/00 (2006.01); G06T 7/60 (2017.01); G06T 7/90 (2017.01); D05B 47/00 (2006.01);
U.S. Cl.
CPC ...
D05B 19/12 (2013.01); D05B 29/06 (2013.01); D05B 55/00 (2013.01); G06T 7/60 (2013.01); G06T 7/90 (2017.01); D05B 47/00 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method for calibrating one or more optical sensors on a sewing machine, including collecting data of one or more features of one or more predefined regions associated with the sewing machine, processing the data through one or more neural networks, wherein the one or more neural networks detect and recognize the one or more features of the one or more predetermined regions from the data, calculating one or more accuracy indicators of the one or more features from the data as compared to one or more trained features from the one or more neural networks, comparing the value of the one or more accuracy indicators to one or more indicator thresholds and adjusting one or more parameters of one or more optical sensors based on the comparison between the one or more accuracy indicators and the one or more indicator thresholds.


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