The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
Nov. 15, 2021
Carl Zeiss Ag, Oberkochen, DE;
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Frank Widulle, Neu-Ulm, DE;
Christian Platt, Ulm, DE;
Thomas Milde, Nausnitz, DE;
Bernhard Wiedemann, Rottenburg, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
In a method for additive manufacturing of a workpiece, a data set defines the workpiece in multiple layers. A first energy beam is moved relative to a manufacturing platform along first trajectories to produce, in temporally successive steps, a stack of workpiece layers. Individual properties of the stack are determined using a measurement arrangement having an exciter that excites the stack with a second energy beam, and having a detector that detects properties of the stack resulting from an excitation along a defined detection path in a spatially resolved manner. At least one of the second energy beam and the detection path is moved relative to the manufacturing platform along further trajectories using a further scanning unit. The first scanning unit and the further scanning unit establish completely separate beam paths for the first energy beam and the at least one of the second energy beam and the detection path.