The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Dec. 20, 2023
Applicant:

Chung Ang University Industry Academic Cooperation Foundation, Seoul, KR;

Inventors:

Joon Ki Paik, Seoul, KR;

Young Chul Youn, Seoul, KR;

Min Jae Kim, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/372 (2021.01); A61B 5/00 (2006.01); G16H 10/60 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
A61B 5/372 (2021.01); A61B 5/4088 (2013.01); A61B 5/7264 (2013.01); G16H 10/60 (2018.01); G16H 50/20 (2018.01);
Abstract

Disclosed are a method and an apparatus for classifying patients with brain disorders based on EEG analysis. The method for classifying patients with brain disorders based on EEG analysis includes: (a) receiving an EEG data set with a clinical diagnosis label, wherein the EEG data set includes a plurality of EEG signals and age information; (b) augmenting the EEG data set through a deep learning-based screening model, and augmenting the EEG signals and the age information in different schemes; (c) training the deep learning-based screening model to classify EEG data of patients into a target clinical diagnosis label by using the augmented EEG signals and age information; and (d) predicting a brain diagnosis label of brain disorders by applying EEG data of patients to the trained deep learning-based screening model.


Find Patent Forward Citations

Loading…