The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Dec. 22, 2021
Applicants:

Board of Regents, the University of Texas System, Austin, TX (US);

Trustees of Boston University, Boston, MA (US);

Inventors:

Timothy James Gardner, Brookline, MA (US);

Stuart F. Cogan, Dallas, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/24 (2021.01); A61L 31/02 (2006.01); A61L 31/06 (2006.01); A61L 31/08 (2006.01); A61L 31/10 (2006.01); A61L 31/14 (2006.01); C23C 16/32 (2006.01); C23C 16/50 (2006.01); C23C 16/56 (2006.01); C23C 28/00 (2006.01); A61B 5/00 (2006.01); A61B 5/291 (2021.01);
U.S. Cl.
CPC ...
A61B 5/24 (2021.01); A61L 31/022 (2013.01); A61L 31/028 (2013.01); A61L 31/06 (2013.01); A61L 31/088 (2013.01); A61L 31/10 (2013.01); A61L 31/14 (2013.01); C23C 16/325 (2013.01); C23C 16/50 (2013.01); C23C 16/56 (2013.01); C23C 28/00 (2013.01); C23C 28/32 (2013.01); C23C 28/341 (2013.01); A61B 5/291 (2021.01); A61B 5/6868 (2013.01); A61B 2562/0209 (2013.01); A61B 2562/043 (2013.01); A61B 2562/125 (2013.01);
Abstract

Manufacturing a neural interface device. Forming a neural interface probe of an implantable microelectrode body. PECVD a first amorphous silicon carbide insulation layer, forming a thin film metal trace and interface pad on the first layer, the pad on a portion of the trace. PECVD a second amorphous silicon carbide insulation layer on the first layer and covering the trace and the pad. Forming an opening in the second layer to expose the pad to an ambient environment. Patterning the first and second layers to define the neural interface probe. The probe has a rectangular cuboid shape, a cross-sectional area perpendicularly transverse to a long axis length of the probe and through any perpendicularly transverse cross-section along the long axis length is less than about 50 microns. The layers are the principle material of construction of the probe.


Find Patent Forward Citations

Gardner, Timothy. (2025). Neural interface device manufacturing method (U.S. Patent No. 12193821). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12193821

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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