The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
May. 28, 2021
Qualcomm Incorporated, San Diego, CA (US);
Wen-Chun Feng, New Taipei, TW;
Wei-Chih Liu, Taipei, TW;
Yi-Chun Hsu, Taipei, TW;
Tai-Hsiang Jen, Taipei, TW;
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A multi-point measurement of a scene captured in an image frame may be used to process the image frame, such as by applying white balance corrections to the image frame. In some examples, the image frame may be segmented into portions that are illuminated by different illumination sources. Different portions of the image frame may be white balanced differently based on the color temperature of the illumination source for the corresponding portion. Infrared measurements of multiple points in the scene may be used to determine a characteristic of the illumination source of different portions of the scene. For example, a picture that includes indoor and outdoor portions may be illuminated by at least two illumination sources that produce different infrared measurements values. White balancing may be applied differently to these two portions to correct for color temperature of the different sources.