The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Mar. 06, 2023
Hunan University, Changsha, CN;
Yunze He, Changsha, CN;
Ruizhen Yang, Changsha, CN;
Hongjin Wang, Changsha, CN;
Zihao Sui, Changsha, CN;
Pan Wang, Changsha, CN;
Xiaofei Zhang, Changsha, CN;
Hunan University, Changsha, CN;
Abstract
A non-destructive testing system for photovoltaic cells includes a non-contact electromagnetic induction device, a short-wave infrared (SWIR) camera or/and a visible-light camera, a thermal imaging device, and an image processing device. The non-contact electromagnetic induction device is configured for generating an external electric field acting on the photovoltaic cell without being in contact with the photovoltaic cell. A direction of the external electric field is parallel to that of an internal electric field of the photovoltaic cell. The SWIR camera or/and the visible-light camera is/are configured for obtaining an optical radiation distribution map within the photovoltaic cell. The thermal imaging device is configured for obtaining a thermal radiation distribution map in the photovoltaic cell. The image processing device is configured for storing and processing the optical and thermal radiation distribution maps. Non-destructive testing equipment including the above system is further provided.