The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Feb. 14, 2023
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Neil Dalchau, Cambridge, GB;

Andrew Nicholas John Brojer Phillips, London, GB;

Paul Grant, Cambridge, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 5/30 (2019.01); C12N 15/63 (2006.01); G16B 5/00 (2019.01); G16B 20/00 (2019.01); G16B 25/00 (2019.01);
U.S. Cl.
CPC ...
G16B 5/30 (2019.02); C12N 15/63 (2013.01); G16B 5/00 (2019.02); G16B 20/00 (2019.02); G16B 25/00 (2019.02);
Abstract

The present invention relates to a method for determining one or more intrinsic properties of a DNA component from a plurality of measurements obtained over a time period from a cell culture, with each cell comprising the DNA component, wherein the DNA component is involved in transcription of one or more target signals, wherein the plurality of measurements comprises measurements relating to the density of the cell culture over the time period and measurements relating to the amount of the one or more target signals in the cell culture over the time period.


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