The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

May. 05, 2022
Applicant:

Beijing Tenafe Electronic Technology Co., Ltd., Beijing, CN;

Inventor:

Yingquan Wu, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01); G11C 29/12 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01); G11C 29/12005 (2013.01); G11C 29/44 (2013.01);
Abstract

A level count disparity is determined based at least in part on: (1) an expected count of a plurality of cells in solid state storage and (2) an observed count of the plurality of cells in the solid state storage, where the observed count is associated with a number of cells in the solid state storage that are activated by performing a single read on the solid state storage using a previous read threshold. A next read threshold is determined, including by: determining a direction relative to the previous read threshold based at least in part on the level count disparity and independent of the second and earlier level count disparity; and determining a magnitude based at least in part on the level count disparity and the second and earlier level count disparity. Read data is obtained using the next read threshold and error correction decoding is performed.


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