The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Jan. 15, 2024
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Joey M. Poss, San Jose, CA (US);

Bernhard E. Knigge, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/54 (2006.01); G11B 5/596 (2006.01); G11B 5/60 (2006.01); G11B 7/1263 (2012.01); G11B 5/00 (2006.01);
U.S. Cl.
CPC ...
G11B 7/1263 (2013.01); G11B 5/6029 (2013.01); G11B 5/607 (2013.01); G11B 2005/0021 (2013.01);
Abstract

Various illustrative aspects are directed to a data storage device comprising a disk, a read/write head configured to read data from and write data to the disk, a laser diode (LD) coupled to a nearfield transducer configured to heat an area of the disk near the read/write head, a first resistive temperature detector (RTD), a second RTD, and one or more processing devices configured to: apply a laser bias to the LD during a write operation; obtain a plurality of differential signal measurements, based at least in part on a plurality of measurements from each of the first and second RTDs; and adjust the laser bias applied to the LD, based at least in part on comparing the plurality of differential signal measurements to a target value for the differential signal.


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