The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Sep. 21, 2023
Applicant:

Lx Semicon Co., Ltd., Daejeon, KR;

Inventors:

Seok Jin Jeong, Daejeon, KR;

Bong Sin Kwak, Daejeon, KR;

Man Jung Kim, Daejeon, KR;

Myung Yu Kim, Daejeon, KR;

Kwang Hee Yoon, Daejeon, KR;

Assignee:

LX SEMICON CO., LTD., Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G06F 11/1004 (2013.01); G09G 2380/10 (2013.01);
Abstract

The present disclosure provides a display device for inspecting image data that may include a data processing device configured to generate first cyclic redundancy check (CRC) data for a partial area among areas of image data included in a first frame to transmit the image data of the first frame and the first CRC data and a data driving device configured to receive the image data of the first frame and the first CRC data from the data processing device to generate second CRC data for a partial area among areas of the image data included in the first frame on the basis of the image data of the first frame and to compare the first CRC data with the second CRC data to determine whether there is an error in the partial area among areas of the image data included in the first frame.


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