The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jan. 24, 2020
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Tomoharu Kiyuna, Tokyo, JP;
Ikuma Takahashi, Tokyo, JP;
Maki Sano, Tokyo, JP;
Kenichi Kamijo, Tokyo, JP;
Kimiyasu Takoh, Tokyo, JP;
Yoshikazu Kitamura, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); A61B 1/04 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61B 1/04 (2013.01); G06T 7/73 (2017.01); G06T 2207/10068 (2013.01); G06T 2207/20084 (2013.01);
Abstract
The acquisition unitB acquires a target image indicating a target object of inspection. The detection unitB detects, on the basis of a group of images each of which indicates the target object in a normal state, the target image that indicates the target object that is not in the normal state among the target images that the acquisition unitB acquires.