The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Nov. 14, 2019
Shimadzu Corporation, Kyoto, JP;
Shinichi Yamaguchi, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An imaging analysis device according to the present invention includes: an analysis execution unit () configured to perform analysis by a predetermined analysis method for each of a plurality of measurement points set in a measurement area on a sample and collect imaging data; a reference image acquiring unit () configured to acquire a reference image for the measurement area; a regression analysis executer () configured to, with respect to the imaging data and the reference image obtained for the same sample, perform predetermined regression analysis calculation with the imaging data as an explanatory variable and data constituting the reference image as a target variable and acquire a regression model; and a predicted image creator () configured to apply, to the regression model, imaging data obtained by the analysis execution unit using a sample different from the sample used in the regression analysis executer, and create a predicted image based on a pseudo regression analysis result.