The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Aug. 26, 2019
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are an image-processing system, an image-processing device, an image-processing method, and an image-processing program capable of appropriately inspecting, measuring, or recognizing targets by using a plurality of imaging units even in a case where there is an individual difference in performance of each imaging unit. An image correction-processing unit that individually acquires pieces of image data from a first camera and a second camera to individually correct image deterioration caused by each of the cameras by pieces of image-processing and an inspection processing unit that individually acquires the pieces of image data after the correction from the image correction-processing unit to individually inspect imaged targets by pieces of image-processing are provided. In a case where the first camera and the second camera image the same targets, the image correction-processing unit individually corrects the image data acquired from each camera such that inspection results match within a desired range.