The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Jan. 11, 2023
Applicant:

Adobe Inc., San Jose, CA (US);

Inventor:

John Peterson, Menlo Park, CA (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/18 (2024.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06T 3/18 (2024.01); G06T 11/60 (2013.01); G06T 2200/24 (2013.01);
Abstract

Methods, systems, and non-transitory computer readable storage media are disclosed for modifying parametric continuity between portions of a digital image in piecewise parametric patch deformations. For example, the disclosed system determine parametric patches in a parametric quilt corresponding to a digital image in response to a request to deform the digital image. The disclosed system divides the digital image into a plurality of separate portions along edges of the parametric patches, each parametric patch comprising a separate set of control points. The disclosed system generates sets of interactive handles for each anchor control point in the parametric patch corresponding to metadata flags that determine parametric continuities between portions of the digital image. Additionally, in response to a user input, the disclosed system modifies the parametric continuity at a portion of the digital image corresponding to an anchor control point by modifying a metadata flag for the control point.


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