The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Jun. 17, 2022
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Miikka Kangasluoma, Pori, FI;

Kiia Kallio, Noormakuu, FI;

Daniel James Skinner, Milton Keynes, GB;

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/10 (2006.01); G06T 15/08 (2011.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/10 (2013.01); G06T 15/08 (2013.01); G06T 17/005 (2013.01); G06T 2210/21 (2013.01);
Abstract

One or more rotated bounding volumes are generated for one or more nodes of a bounding volume hierarchy (BVH). Volume intersection ray tracing tests are then be performed using the rotated bounding volumes with the aim of reducing the number of calculations required relative to an original, non-rotated bounding volume. Rotated bounding volumes are selected from a plurality of candidate rotations, and selection of one of the candidate rotations are based on surface areas, such as minimum total surface areas, of bounding volumes corresponding to each of the candidate rotations. In order to minimize data storage and increase performance, a number of candidate rotations may be limited to a predetermined set of rotations.


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