The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Oct. 25, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Nitin Gupta, Saharanpur, IN;

Shashank Mujumdar, Nagpur, IN;

Ruhi Sharma Mittal, Bengaluru, IN;

Hima Patel, Bengaluru, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2457 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/24573 (2019.01); G06F 16/24578 (2019.01);
Abstract

Automatically selecting data for machine learning datasets is provided. The method comprises receiving an input dataset and user-specified data quality metrics. The input dataset is matched to a subset of candidate datasets in a repository according to schema characteristics. A second subset of candidate datasets having a distance from the input dataset above a specified threshold is selected from the first subset of candidate datasets. The second subset of candidate datasets are merged into a merged dataset. Top ranked samples above a specified second threshold are identified from the merged dataset based on the user-specified data quality metrics. The input dataset, augmented with the top ranked samples, is returned to the user.


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