The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Jun. 12, 2023
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Waad Subber, Niskayuna, NY (US);

Ankit Singh, Apex, NC (US);

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 18/2431 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2431 (2023.01); G06F 16/906 (2019.01);
Abstract

A multi-class classification system performs multi-class classification using an adapted, multi-level binary classification model in conjunction with pre-classification and post-classification processing. Original, multi-class training data is transformed into coarse-level adapted training data and fine-level adapted training data. In the coarse-level adapted training data, objects from the original training set are classified into either a majority classification set (representing the largest original classification set) or a non-majority classification set representing a combination of the remaining classification sets from the original training data. In the fine-level adapted training data, objects from the non-majority classification set retain their original classifications from the original training data. The adapted training data is used to train coarse-level and fine-level instances of the binary classification model, which are used to generate coarse-level and fine-level binary classifications of objects with respect to an input data set. The binary classifications are transformed into a multi-class classification.


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