The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
May. 28, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Matthew T. Gerdes, Oakland, CA (US);
Guang C. Wang, San Diego, CA (US);
Kenny C. Gross, Escondido, CA (US);
Timothy David Cline, Gainesville, VA (US);
Oracle International Corporation, Redwood City, CA (US);
Abstract
The disclosed system produces synthetic signals for testing machine-learning systems. During operation, the system generates a set of N composite sinusoidal signals, wherein each of the N composite sinusoidal signals is a combination of multiple constituent sinusoidal signals with different periodicities. Next, the system adds time-varying random noise values to each of the N composite sinusoidal signals, wherein a standard deviation of the time-varying random noise values varies over successive time periods. The system also multiplies each of the N composite sinusoidal signals by time-varying amplitude values, wherein the time-varying amplitude values vary over successive time periods. Finally, the system adds time-varying mean values to each of the N composite sinusoidal signals, wherein the time-varying mean values vary over successive time periods. The time-varying random noise values, amplitude values and mean values can be selected through a roll-of-the-die process from a library of values, which are learned from industry-specific signals.