The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Mar. 09, 2022
The Boeing Company, Chicago, IL (US);
University of Washington, Seattle, WA (US);
Mohammed H. Kabir, Mukilteo, WA (US);
Alan Douglas Byar, Issaquah, WA (US);
John J. Dong, Bothell, WA (US);
Alexandru I. Stere, Mukilteo, WA (US);
Todd Clayton DePauw, Mukilteo, WA (US);
Christina M. Doty, Seattle, WA (US);
Ashith Paulson Kunnel Joseph, Seattle, WA (US);
Navid Zobeiry, Bothell, WA (US);
The Boeing Company, Chicago, IL (US);
University of Washington, Seattle, WA (US);
Abstract
A method, apparatus, system, and computer program products for managing a set of outliers in test data. A computer system analyzes a set of features derived from the test data using different outlier detection methods to generate a result of the set of outliers identified by the different outlier detection methods. The test data is obtained from testing a physical structure. The computer system determines a causality for the set of outliers in the result. The physical structure is retested with a set of changes determined using the causality identified for the set of outliers. The retesting generates new test data for the physical structure.