The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Nov. 11, 2021
Applicant:

Nanjing University of Aeronautics and Astronautics, Jiangsu, CN;

Inventors:

Yan Chen, Jiangsu, CN;

Nan Guo, Jiangsu, CN;

Chaoren Yan, Jiangsu, CN;

Yucan Fu, Jiangsu, CN;

Honghua Su, Jiangsu, CN;

Jiuhua Xu, Jiangsu, CN;

Quanli Zhang, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); B23Q 15/013 (2006.01); B23Q 15/12 (2006.01); B23Q 17/09 (2006.01);
U.S. Cl.
CPC ...
G05B 19/401 (2013.01); B23Q 15/013 (2013.01); B23Q 15/12 (2013.01); B23Q 17/0961 (2013.01); B23Q 17/0971 (2013.01); G05B 2219/36284 (2013.01);
Abstract

A state monitoring method for vibration drilling of a stack structure material is provided. A load power and a torque value of a drilling spindle is monitored during machining. Drilling state are divided according to a machining material of a drill. According to a data of a test library, reference thresholds of two monitoring objects for judging the change of the drilling state are set to achieve the state monitoring for the drilling process. The method monitors the machining process through the monitoring module in the machining system.


Find Patent Forward Citations

Chen, Yan. (2025). Monitoring method for vibration drilling state of stack structure material (U.S. Patent No. 12189358). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12189358

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…