The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Feb. 17, 2022
Applicant:

Leia Inc., Menlo Park, CA (US);

Inventors:

David A. Fattal, Menlo Park, CA (US);

Ming Ma, Menlo Park, CA (US);

Joseph D. Lowney, Menlo Park, CA (US);

Assignee:

LEAI INC., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V 8/00 (2006.01);
U.S. Cl.
CPC ...
G02B 6/0055 (2013.01);
Abstract

A backlight scattering element, multiview display, and method of backlight scattering element operation employ a high-index light guide layer in conjunction with a light guide and diffraction grating to provide emitted light. The backlight scattering element includes a light guide that guides light as guided light and a high-index light guide layer optically connected to the light guide and configured to extend a thickness of the light guide. The backlight scattering element also includes a diffraction grating adjacent to the high-index light guide layer to diffractively scatter out a portion of the guided light as emitted light. The multiview display includes a light guide having a first layer and a second layer, a refractive index of the second layer being greater than a refractive index of the first layer. The multiview display may modulate diffractively scattered out directional light beams to provide a multiview image.


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