The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2025

Filed:

Sep. 07, 2018
Applicant:

Dai Nippon Printing Co., Ltd., Tokyo-to, JP;

Inventors:

Tsuyoshi Yamauchi, Tokyo-to, JP;

Mitsuru Kitamura, Tokyo-to, JP;

Tomoe Sato, Tokyo-to, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); B42D 25/328 (2014.01); G02B 5/32 (2006.01); G03H 1/02 (2006.01);
U.S. Cl.
CPC ...
G02B 5/32 (2013.01); B42D 25/328 (2014.10); G03H 1/0272 (2013.01);
Abstract

A light modulation element reproduces a light image in a specific color other than iridescence where white light is incident, without a layer that selectively transmits or reflects a specific wavelength band, and clearly reproduces a desired light image by reducing an influence of 0th-order diffracted light, and an information recording medium including the same. The light modulation element includes a factor element that reproduces a light image by modulating a phase of incident reproduction light, and has an uneven surface. A maximum diffraction efficiency Dmax in a wavelength band of between 380 nm and 780 nm in wavelength distribution of first-order diffracted light and of negative first-order diffracted light with respect to diffraction efficiency for the factor element has a local maximum value with a full width at half maximum FWHM of 200 nm or less in wavelength distribution with respect to diffraction efficiency having the maximum diffraction efficiency.


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